2853
 Paxco Testing Report
Part Number XXXXXXX Total Substrates Received 108
Total Circuits Broken 155
Lot Number XXXXXXXX Total Circuits Pre-Scraped 85
Job Number Total Circuits Tested 2676
P.O. Number Total Circuits Tested Bad 73
Total Circuits Good 2603
Date Testing Started 9/10/03 Total Nodes Tested 267600
Date Testing Ended In Process Total Nodes Bad 308
Total Nodes Good 267292
Tested Circuit Yield for Lot 97 Total Circuit Yield for Lot 89
  # of Circuits Substrate Yield
    Substrate #   Broken   Pre-Scraped   Tested Failed Tested   All
    1   0   0   27 1 96   96
  Circuit #   Status   Pre-Scraped   Broken   Number of Nodes Failed    
  13 0 Failed 0 No 0 No   3    
  Node #   Status   Measured Value   Acceptable Range   Failer
  2 0 Failed   14.666   9.649 thru 17.92 3 Nodes Shorted
  9 0 Failed   14.666   9.223 thru 17.129 3 Nodes Shorted
  92 0 Failed   14.704   9.673 thru 17.965 3 Nodes Shorted
  # of Circuits Substrate Yield
    Substrate #   Broken   Pre-Scraped   Tested Failed Tested   All
    2   0   0   27 0 100   100
  # of Circuits Substrate Yield
    Substrate #   Broken   Pre-Scraped   Tested Failed Tested   All
    3   0   0   27 0 100   100
  # of Circuits Substrate Yield
    Substrate #   Broken   Pre-Scraped   Tested Failed Tested   All
    4   0   0   27 0 100   100
  # of Circuits Substrate Yield
    Substrate #   Broken   Pre-Scraped   Tested Failed Tested   All
    5   0   0   27 1 96   96
  Circuit #   Status   Pre-Scraped   Broken   Number of Nodes Failed    
  12 0 Failed 0 No 0 No   3    
  Node #   Status   Measured Value   Acceptable Range   Failer
  6 0 Failed   4.177   4.286 thru 7.96 1 Open
  55 0 Failed   2.457   4.287 thru 7.962 1 Open
  74 0 Failed   2.45   4.282 thru 7.953 1 Open
  # of Circuits Substrate Yield
    Substrate #   Broken   Pre-Scraped   Tested Failed Tested   All
    6   0   0   27 0 100   100
  # of Circuits Substrate Yield
    Substrate #   Broken   Pre-Scraped   Tested Failed Tested   All
    7   0   0   27 0 100   100
  # of Circuits Substrate Yield
    Substrate #   Broken   Pre-Scraped   Tested Failed Tested   All
    8   0   0   27 1 96   96
  Circuit #   Status   Pre-Scraped   Broken   Number of Nodes Failed    
  12 0 Failed 0 No 0 No   5    
  Node #   Status   Measured Value   Acceptable Range   Failer
  10 0 Failed   0   15.352 thru 35.82 2 Short
  15 0 Failed   0   15.352 thru 35.82 2 Short
  21 0 Failed   0   15.358 thru 35.836 2 Short
  24 0 Failed   0   15.361 thru 35.843 2 Short